INVESTIGATION OF THE CRYSTAL STRUCTURE AND ELECTROPHYSICAL PROPERTIES OF ZNO THIN FILMS GROWN BY ION-PLASMA DEPOSITION
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Keywords

ZnO thin films, ion-plasma deposition, crystal structure, electrophysical properties, semiconductor materials, dielectric substrate, electrical conductivity, wurtzite structure.

How to Cite

INVESTIGATION OF THE CRYSTAL STRUCTURE AND ELECTROPHYSICAL PROPERTIES OF ZNO THIN FILMS GROWN BY ION-PLASMA DEPOSITION. (2026). Global Conference on Multidisciplinary Research and Innovation, 1(5), 268-279. https://www.econferencia.com/index.php/1/article/view/775

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Abstract

Zinc oxide (ZnO) thin films are widely used in modern electronics, optoelectronics, sensor systems, and photovoltaic technologies due to their unique structural and electrophysical properties. The characteristics of ZnO films strongly depend on deposition conditions and technological parameters used during synthesis. Among various fabrication methods, ion-plasma deposition is considered one of the most effective techniques for obtaining high-quality semiconductor thin films with controlled structural properties.

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